QT-8400 power device multi-site test system
Explore the infinite possibilities of third-generation transistors

test host

GaN Test Kit

Power Device Test Kit

QT-8400 is composed of test host and test station Test Kit,
There are two types of Test Kit: Power Device Test Kit & GaN Test Kit.

Test Kit
Can be selected according to needs
  • Power Device Test Kit

    Power Device Test Kit for CP testing needs such as MOSFET/SIC, diodes, transistors, etc.

  • GaN Test Kit

    GaN Test Kit for Gallium Nitride testing needs.

105cm
Standing keyboard height
75cm
Sitting keyboard height
Heart-touching
user experience

Based on the ergonomic design, the 8400 main case is designed for different environments such as design companies, laboratories, and packaging and testing factories to meet the user's keyboard operation needs in different standing and sitting postures. We have designed a unique guide line. , allowing users to quickly find the recommended keyboard height when standing or sitting, and can also fine-tune it according to personal height differences, which greatly improves operating comfort and efficiency.

* Patent applied

105cm
Standing keyboard height
75cm
Sitting keyboard height

QT-8400 GaN

QT-8400 D

Test Range

Dedicated to testing dynamic and static electrical parameters of gallium nitride

Test Range

Dedicated to MOSFET/SIC, diodes, transistors, IGBT and other CP testing.

Parameter index

Floating V/I Source
Voltage 1KV/2KV
20A/100A;

Parameter index

Floating V/I Source
Voltage 1KV/2KV/3KV
20A/100A/200A

Number of parallel tests

2/4/8/16 Site

Number of parallel tests

2/4/8/16 Site

Extensible dynamic modules

LCR test module (CG)
Dynamic RDSON module (supports hard and soft cutting)

Extensible dynamic modules

Avalanche test module (UIS, EAS)
LCR test module (RG, CG)

Expandable high voltage/DC module

Expandable up to 8KV, 2KA

Expandable high voltage/DC module

Expandable up to 8KV, 2KA

Precise measurement

The GaN Test Kit has a built-in precision measurement circuit to achieve accurate measurements at the nA level and mΩ level.

Precise measurement

The Power Device Test Kit has a built-in precision measurement circuit to achieve nA-level and mΩ-level accurate measurements.

Built-in oscilloscope graph

AWG Editor

* Patent applied