QP3000
Suitable for automatic probe testing of wafers such as 8 and 12″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc. Automatic loading and unloading, Wafer ID reading. Fully automatic CCD visual needle positioning. High precision positioning platform. Support high temperature testing. Real time generation of Mapping display Bin. Universal GPIB, TTL, R-232 interfaces.
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Suspended power supply |
Multiple sites in parallel |
Multi-channel high precision |
Supports multiple extensions |
| Model | QP3000 |
| Product introduction |
Suitable for automatic probe testing of wafers such as 8 and 12″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc.
Automatic loading and unloading, Wafer ID reading. |
| Features |
• Fully automatic CCD visual needle positioning. • High-precision positioning platform. • Support normal high temperature testing. • Generate Mapping display Bin in real time. • Universal GPIB, TTL, R-232 interface. |
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No. 16 Guangming Avenue, New Light Source Industry Base, Nanhai National High tech Zone, Foshan City, Guangdong Province, China |
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+86 757 83207313 (Sales) |
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+86 757 83208786 (Sales) |
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info@powertechsemi.com |
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