Low spurious 247/TPAK dynamic test solution: consists of QT-3108SW dynamic test system and gravity handler.
Supports dynamic parameter testing of TO247/TPAK SiC MOS IGBT packaged devices.
● RG 1-512 linearly adjustable
● Load inductance 10-1100uH step 10uH
● Short circuit protection<1us
● Support KGD test pin card protection circuit
QT-3108SW has complete functions and supports SW, ISC, TRR (series parameters),
ILATCH, SCSOA, QG parameter testing, optional UIS.
Application EnvironmentThe test application board is directly connected to the handler |
Turn-on/turn-off delay TDON/TDOFF
Measuring range: 0~2us |
Rise/fall time TR/TF
Measuring range: 0~2us |
Reverse recovery time TRR
Measuring range: 0~5us |
Reverse recovery charge QRR
Measuring range: 0～10uC; |
Total gate charge QG
Measuring range: 0~100uC; |
Short circuit current SCCOA
Measuring range: 0~5000 A; |
Clamp current ILATCH
Measuring range: 25~1000 A; |
Threshold voltage VTH
Measuring range: 0～10.0V; |
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To solve the problem of poor test results caused by wire distributed inductance.
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No. 16 Guangming Avenue, New Light Source Industry Base, Nanhai National High tech Zone, Foshan City, Guangdong Province, China |
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+86 757 83207313 (Sales) |
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+86 757 83208786 (Sales) |
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info@powertechsemi.com |
